Publication:
Extraction of the minority carrier recombination lifetime from forward diode characteristics
Date
| dc.contributor.author | Vanhellemont, Jan | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-09-29T13:22:25Z | |
| dc.date.available | 2021-09-29T13:22:25Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/976 | |
| dc.source.beginpage | 2894 | |
| dc.source.endpage | 6 | |
| dc.source.issue | 21 | |
| dc.source.journal | Appl. Phys. Lett. | |
| dc.source.volume | 66 | |
| dc.title | Extraction of the minority carrier recombination lifetime from forward diode characteristics | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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