Publication:
Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1991 since deposited on 2021-10-01
1last month
1last week
Acq. date: 2026-01-25
Citations
Statistics
Views
1991 since deposited on 2021-10-01
1last month
1last week
Acq. date: 2026-01-25
Citations