Publication:
Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1988 since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations
Metrics
Views
1988 since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations