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Optimised diode assessment of the surface and bulk generation/recombination properties of silicon substrates

Date

1998
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorPoyai, Amporn
dc.contributor.authorClaeys, Cor
dc.contributor.authorCzerwinski, A.
dc.contributor.authorKatcki, J.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-01T08:57:09Z
dc.date.available2021-10-01T08:57:09Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2954
dc.source.beginpage1576
dc.source.conferenceSemiconductor Silicon 1998. Proceedings of the 8th International Symposium on Silicon Materials Science and Technology
dc.source.conferencedate4/05/1998
dc.source.conferencelocationSan Diego, CA USA
dc.source.endpage1592
dc.title

Optimised diode assessment of the surface and bulk generation/recombination properties of silicon substrates

dc.typeProceedings paper
dspace.entity.typePublication
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