Publication:

Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack

Date

2011
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGoux, Ludovic
dc.contributor.authorRoussel, Philippe
dc.contributor.authorWouters, Dirk
dc.contributor.authorKittl, Jorge
dc.contributor.authorAltimime, Laith
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-19T13:11:28Z
dc.date.available2021-10-19T13:11:28Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18819
dc.source.beginpage28
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate13/06/2011
dc.source.conferencelocationJapan Kyoto
dc.source.endpage30
dc.title

Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
22324.pdf
Size:
361.03 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions