Publication:

Reliability and performance considerations for NMOSFET pass gates in FPGA applications

Date

2013
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorChen, Chris
dc.contributor.authorWatt, Jeff
dc.contributor.authorChanda, Kaushik
dc.contributor.authorWeckx, Pieter
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChen, Chris
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-21T08:38:46Z
dc.date.available2021-10-21T08:38:46Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22562
dc.source.conferenceInternational Integrated Reliability Workshop - IIRW
dc.source.conferencedate13/10/2013
dc.source.conferencelocationSouth Lake Tahoe, CA USA
dc.title

Reliability and performance considerations for NMOSFET pass gates in FPGA applications

dc.typeProceedings paper
dspace.entity.typePublication
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