Publication:

Recent trends in CMOS reliability: from individual traps to circuit simulations

Date

2012
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Author(s)

Kaczer, Ben  
;
Toledano Luque, Maria
;
Franco, Jacopo  
;
Grasser, Tibor
;
Roussel, Philippe  
;
Camargo, V. V. A.
;
Mahato, S.
;
Simoen, Eddy  
;
Catthoor, Francky  
;
Wirth, G. I.
;
Groeseneken, Guido  

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1877 since deposited on 2021-10-20
Acq. date: 2026-02-26

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1877 since deposited on 2021-10-20
Acq. date: 2026-02-26

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