Publication:

Hot-carrier phenomena in MOS field-effect transistors: analysis techniques, injection mechanisms and degradation models

Date

1990
Dissertation
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-2151-1718
cris.virtualsource.department9261d824-ba53-4b1b-ae41-3ce80cc80ca1
cris.virtualsource.orcid9261d824-ba53-4b1b-ae41-3ce80cc80ca1
dc.contributor.advisorMaes, H.
dc.contributor.authorHeremans, Paul
dc.date.accessioned2026-06-15T13:28:56Z
dc.date.available2026-06-15T13:28:56Z
dc.date.issued1990
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59711
dc.provenance.editstepusermeghan.oneill@imec.be
dc.title

Hot-carrier phenomena in MOS field-effect transistors: analysis techniques, injection mechanisms and degradation models

dc.typePHD thesis
dspace.entity.typePublication
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