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Articles
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability
Publication:
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability
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Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Li, Yunlong
;
Tokei, Zsolt
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maex, Karen
Journal
Microelectronics Reliability
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Views
1824
since deposited on 2021-10-16
4
last month
1
last week
Acq. date: 2026-08-08
Citations