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Numerical and experimental analysis of stretching induced interconnect delamination for stretchable electronic circuits

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dc.contributor.authorvan der Sluis, Olaf
dc.contributor.authorHsu, Yung-Yu
dc.contributor.authorTimmermans, P.H.M.
dc.contributor.authorGonzalez, Mario
dc.contributor.authorHoefnagels, J.P.M.
dc.contributor.imecauthorGonzalez, Mario
dc.date.accessioned2021-10-18T22:59:06Z
dc.date.available2021-10-18T22:59:06Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18170
dc.source.conference18th European Conference on Fracture, Fracture of Materials and Structures from Micro to Macro Scale
dc.source.conferencedate30/08/2010
dc.source.conferencelocationDresden Germany
dc.title

Numerical and experimental analysis of stretching induced interconnect delamination for stretchable electronic circuits

dc.typeMeeting abstract
dspace.entity.typePublication
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