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Tolerance analysis of the performance of an integrated pseudo-random light-field projector

Date

2016
Presentation
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dc.contributor.authorMukund, Vignesh
dc.contributor.authorVercruysse, Dries
dc.contributor.authorSong, Jeonghwan
dc.contributor.authorJansen, Roelof
dc.contributor.authorClaes, Tom
dc.contributor.authorVan Dorpe, Pol
dc.contributor.authorLagae, Liesbet
dc.contributor.authorRottenberg, Xavier
dc.contributor.imecauthorSong, Jeonghwan
dc.contributor.imecauthorJansen, Roelof
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.orcidimecSong, Jeonghwan::0000-0001-9284-2632
dc.contributor.orcidimecJansen, Roelof::0000-0001-6685-4699
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.date.accessioned2021-10-23T13:06:02Z
dc.date.available2021-10-23T13:06:02Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27052
dc.source.conferenceNanophotonics Conference at SPIE Photonics Europe
dc.source.conferencedate3/04/2016
dc.source.conferencelocationBrussels Belgium
dc.title

Tolerance analysis of the performance of an integrated pseudo-random light-field projector

dc.typeOral presentation
dspace.entity.typePublication
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