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Comparison of Bosch and cryogenic processes for patterning high aspect ration features in silicon
Publication:
Comparison of Bosch and cryogenic processes for patterning high aspect ration features in silicon
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Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Walker, M. J.
;
de Boer, M. J.
;
Jansen, Henri
Journal
Abstract
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1940
since deposited on 2021-10-14
3
last month
Acq. date: 2025-12-11
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Metrics
Views
1940
since deposited on 2021-10-14
3
last month
Acq. date: 2025-12-11
Citations