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Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs
Publication:
Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Buhler, Rudolf
;
Agopian, Paula GD
;
Collaert, Nadine
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, Joao
Journal
Solid-State Electronics
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1927
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Acq. date: 2025-12-11
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Views
1927
since deposited on 2021-10-22
2
last month
1
last week
Acq. date: 2025-12-11
Citations