Publication:
Automated design-for-test for 2.5D and 3D SICs
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Konijnenburg, Mario | |
| dc.contributor.author | Deutsch, Sergej | |
| dc.contributor.author | Keller, Brion | |
| dc.contributor.author | Chickermane, Vivek | |
| dc.contributor.author | Mukherjee, Subhasish | |
| dc.contributor.author | Goel, Sandeep K. | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Konijnenburg, Mario | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.contributor.orcidimec | Konijnenburg, Mario::0000-0001-8016-0888 | |
| dc.date.accessioned | 2021-10-19T16:04:46Z | |
| dc.date.available | 2021-10-19T16:04:46Z | |
| dc.date.issued | 2011-09 | |
| dc.identifier.issn | 1526-1344 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19389 | |
| dc.identifier.url | http://www.chipscalereview.com/issues/0911/ | |
| dc.source.beginpage | 18 | |
| dc.source.endpage | 22 | |
| dc.source.issue | 5 | |
| dc.source.journal | Chip Scale Review | |
| dc.source.volume | ? | |
| dc.title | Automated design-for-test for 2.5D and 3D SICs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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