Publication:
Real-Time MOSFET Condition Monitoring for Variable Mission Profiles With a Dual Extended Kalman Filter
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-9221-4932 | |
| cris.virtual.orcid | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtualsource.department | 6135dbc2-f1c6-4a89-ab31-0608a53994c6 | |
| cris.virtualsource.department | 5d22889d-a568-4860-af79-f9efe51000b4 | |
| cris.virtualsource.orcid | 6135dbc2-f1c6-4a89-ab31-0608a53994c6 | |
| cris.virtualsource.orcid | 5d22889d-a568-4860-af79-f9efe51000b4 | |
| dc.contributor.author | Deckers, Martijn | |
| dc.contributor.author | Van Cappellen, Leander | |
| dc.contributor.author | Moschner, Jens | |
| dc.contributor.author | Daenen, Michaël | |
| dc.contributor.author | Driesen, Johan | |
| dc.contributor.imecauthor | Van Cappellen, Leander | |
| dc.contributor.imecauthor | Daenen, Michael | |
| dc.date.accessioned | 2024-12-31T16:56:43Z | |
| dc.date.available | 2024-12-31T16:56:43Z | |
| dc.date.issued | 2025-JAN | |
| dc.description.wosFundingText | This work was supported by the Flanders Innovation & Entrepreneurship and Flux50 under project DAPPER under Grant HBC.2020.2144. The work of Martijn Deckers was supported by a Ph.D. grant from the Research Foundation Flanders (FWO) under Grant 1S87522N.Recommended for publication by Associate Editor H. Luo. | |
| dc.identifier.doi | 10.1109/TPEL.2024.3480704 | |
| dc.identifier.issn | 0885-8993 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45028 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 2219 | |
| dc.source.endpage | 2234 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE TRANSACTIONS ON POWER ELECTRONICS | |
| dc.source.numberofpages | 16 | |
| dc.source.volume | 40 | |
| dc.subject.keywords | POWER | |
| dc.subject.keywords | TEMPERATURE | |
| dc.subject.keywords | FAILURE | |
| dc.subject.keywords | MODULES | |
| dc.title | Real-Time MOSFET Condition Monitoring for Variable Mission Profiles With a Dual Extended Kalman Filter | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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