Publication:
Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
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1869 since deposited on 2021-10-14
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Acq. date: 2025-12-15
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Views
1869 since deposited on 2021-10-14
2last month
2last week
Acq. date: 2025-12-15
Citations