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Conference contributions
Characterization and modeling of reliability issues in nanoscale devices
Publication:
Characterization and modeling of reliability issues in nanoscale devices
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Date
2015
Proceedings Paper
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33149.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rzepa, Gerhard
;
Goes, Wolfgang
;
Kaczer, Ben
;
Grasser, Tibor
Journal
Abstract
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1847
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Acq. date: 2025-12-10
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Metrics
Views
1847
since deposited on 2021-10-22
2
last month
Acq. date: 2025-12-10
Citations