Publication:

Microwave characterization of Ba-substituted PZT and ZnO thin films

Date

2018
Journal article
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dc.contributor.authorTierno, Davide
dc.contributor.authorDekkers, Matthijn
dc.contributor.authorWittendorp, Paul
dc.contributor.authorSun, Xiao
dc.contributor.authorBayer, Samuel C.
dc.contributor.authorKing, Seth T.
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorHeyns, Marc
dc.contributor.authorRadu, Iuliana
dc.contributor.authorAdelmann, Christoph
dc.contributor.imecauthorTierno, Davide
dc.contributor.imecauthorSun, Xiao
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.orcidimecTierno, Davide::0000-0003-4915-904X
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.date.accessioned2021-10-26T05:40:41Z
dc.date.available2021-10-26T05:40:41Z
dc.date.issued2018
dc.identifier.issn0885-3010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31947
dc.identifier.urlhttps://doi.org/10.1109/TUFFC.2018.2812424
dc.source.beginpage881
dc.source.endpage888
dc.source.issue5
dc.source.journalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
dc.source.volume65
dc.title

Microwave characterization of Ba-substituted PZT and ZnO thin films

dc.typeJournal article
dspace.entity.typePublication
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