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On the impact of the gate metal work-function on the charge trapping component of BTI
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On the impact of the gate metal work-function on the charge trapping component of BTI
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Date
2018-10
Proceedings Paper
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39474.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Wu, Zhicheng
;
Rzepa, Gerhard
;
Ragnarsson, Lars-Ake
;
Dekkers, Harold
;
Vandooren, Anne
;
Groeseneken, Guido
;
Horiguchi, Naoto
;
Collaert, Nadine
;
Linten, Dimitri
;
Grasser, Tibor
;
Kaczer, Ben
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since deposited on 2021-10-25
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Acq. date: 2025-12-15
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Downloads
1
since deposited on 2021-10-25
Acq. date: 2025-12-15
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1894
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-15
Citations