Publication:

Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stack

Date

1999
Proceedings Paper
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Author(s)

Degraeve, Robin  
;
Kaczer, Ben  
;
Houssa, Michel  
;
Groeseneken, Guido  
;
Heyns, Marc  
;
Jeon, J. S.
;
Halliyal, A.

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2018 since deposited on 2021-10-06
Acq. date: 2026-09-09

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2018 since deposited on 2021-10-06
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