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Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stack
Publication:
Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stack
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Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Kaczer, Ben
;
Houssa, Michel
;
Groeseneken, Guido
;
Heyns, Marc
;
Jeon, J. S.
;
Halliyal, A.
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2007
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
2007
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-10
Citations