Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Hot topics in IC and electronic system testing – from all angles
Publication:
Hot topics in IC and electronic system testing – from all angles
Copy permalink
Date
2021
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Gielen, Georges
;
Stucchi, Michele
;
V "at "ajelu, Elena-Ioana
Journal
Bits and Chips
Abstract
Description
Statistics
Views
1927
since deposited on 2021-10-31
1
last month
Acq. date: 2026-08-09
Citations
Statistics
Views
1927
since deposited on 2021-10-31
1
last month
Acq. date: 2026-08-09
Citations