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Reliability issues in high-k stacks
Publication:
Reliability issues in high-k stacks
Date
2004-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Crupi, Felice
;
Houssa, Michel
;
Kwak, Dong Hwa
;
Kerber, Andreas
;
Cartier, Eduard
;
Kauerauf, Thomas
;
Roussel, Philippe
;
Autran, Jean-Luc
;
Pourtois, Geoffrey
;
Pantisano, Luigi
;
De Gendt, Stefan
;
Heyns, Marc
;
Groeseneken, Guido
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1922
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1922
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations