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Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability
Publication:
Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability
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Date
2016
Proceedings Paper
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35044.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Agbo, Innocent
;
Taouil, Mottaqiallah
;
Hamdioui, Said
;
Weckx, Pieter
;
Cosemans, Stefan
;
Raghavan, Praveen
;
Catthoor, Francky
;
Dehaene, Wim
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1914
since deposited on 2021-10-23
Acq. date: 2025-12-12
Citations
Metrics
Views
1914
since deposited on 2021-10-23
Acq. date: 2025-12-12
Citations