Publication:
ESD challenges in advanced FinFET and GAA nanowire CMOS technologies
Date
| dc.contributor.author | Chen, Shih-Hung | |
| dc.contributor.imecauthor | Chen, Shih-Hung | |
| dc.date.accessioned | 2021-10-25T17:11:40Z | |
| dc.date.available | 2021-10-25T17:11:40Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30402 | |
| dc.identifier.url | https://www.esda.org/assets/Updates/New%20directory/2018%20Symposium%20Program%20v25.pdf | |
| dc.source.conference | 2018 EOS/ESD Symposium | |
| dc.source.conferencedate | 23/09/2018 | |
| dc.source.conferencelocation | Reno, NV USA | |
| dc.title | ESD challenges in advanced FinFET and GAA nanowire CMOS technologies | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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