Publication:
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | De Wachter, Bart | |
| dc.contributor.author | Smith, Ken | |
| dc.contributor.author | Kiesewetter, Joerg | |
| dc.contributor.author | Taouil, Mottaqiallah | |
| dc.contributor.author | Hamdioui, Said | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | De Wachter, Bart | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-22T03:31:24Z | |
| dc.date.available | 2021-10-22T03:31:24Z | |
| dc.date.issued | 2014-10 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24208 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7035314 | |
| dc.source.beginpage | 1 | |
| dc.source.conference | IEEE International Test Conference - ITC | |
| dc.source.conferencedate | 21/10/2014 | |
| dc.source.conferencelocation | Seattle, WA USA | |
| dc.source.endpage | 10 | |
| dc.title | Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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