Publication:
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1953 since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations
Metrics
Views
1953 since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations