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Conference contributions
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs
Publication:
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs
Date
2013
Meeting abstract
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26924.pdf
32.82 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Lee, Jae Woo
;
Veloso, Anabela
;
Paraschiv, Vasile
;
Horiguchi, Naoto
;
Claeys, Cor
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Abstract
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1951
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations
Metrics
Views
1951
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations