Publication:

Soft and Hard Error-Correction Techniques in STT-MRAM

Date

2024
Journal article
https://doi.org/10.1109/MDAT.2024.3395972
Simple item page Full metadata Statistics
 
dc.contributor.authorHemaram, Surendra
dc.contributor.authorTahoori, Mehdi B.
dc.contributor.authorCatthoor, Francky
dc.contributor.authorRao, Siddharth
dc.contributor.authorCouet, Sebastien
dc.contributor.authorPica, Valerio
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorPica, Valerio
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecPica, Valerio::0009-0004-2468-4029
dc.date.accessioned2025-01-23T09:26:16Z
dc.date.available2024-09-08T18:19:51Z
dc.date.available2025-01-23T09:26:16Z
dc.date.issued2024
dc.identifier.doi10.1109/MDAT.2024.3395972
dc.identifier.issn2168-2356
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44430
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage65
dc.source.endpage82
dc.source.issue5
dc.source.journalIEEE DESIGN & TEST
dc.source.numberofpages18
dc.source.volume41
dc.subject.keywordsNONVOLATILE MEMORY
dc.title

Soft and Hard Error-Correction Techniques in STT-MRAM

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles