Publication:
Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness
Date
| dc.contributor.author | Poliakov, Pavel | |
| dc.contributor.author | Blomme, Pieter | |
| dc.contributor.author | Miranda Corbalan, Miguel | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | Dehaene, Wim | |
| dc.contributor.imecauthor | Blomme, Pieter | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | Dehaene, Wim | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-19T17:24:06Z | |
| dc.date.available | 2021-10-19T17:24:06Z | |
| dc.date.issued | 2011-05 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19584 | |
| dc.source.beginpage | 919 | |
| dc.source.endpage | 924 | |
| dc.source.issue | 5 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 51 | |
| dc.title | Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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