Publication:

Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

Date

2020
Meeting abstract
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dc.contributor.authorSyshchyk, Olga
dc.contributor.authorMotsnyi, Vasyl
dc.contributor.authorPuybaret, Renaud
dc.contributor.authorLee, Jiwon
dc.contributor.authorKarve, Gauri
dc.contributor.authorPuers, Bob
dc.contributor.authorVan Hoof, Chris
dc.contributor.imecauthorSyshchyk, Olga
dc.contributor.imecauthorMotsnyi, Vasyl
dc.contributor.imecauthorPuybaret, Renaud
dc.contributor.imecauthorLee, Jiwon
dc.contributor.imecauthorKarve, Gauri
dc.contributor.imecauthorPuers, Bob
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecMotsnyi, Vasyl::0000-0001-5297-9298
dc.contributor.orcidimecLee, Jiwon::0000-0003-3738-4872
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.date.accessioned2021-10-29T05:03:00Z
dc.date.available2021-10-29T05:03:00Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36037
dc.identifier.urlhttps://confit.atlas.jp/guide/event/ssdm2020/subject/D-5-04/date?cryptoId=
dc.source.beginpageS-5-04
dc.source.conference2020 International Conference on Solid States Devices and Materials - SSDM
dc.source.conferencedate28/09/2020
dc.source.conferencelocationVirtual Japan
dc.title

Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

dc.typeMeeting abstract
dspace.entity.typePublication
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