Publication:

Electrical interface characterization of non-Si Based MOSFETs: challenges and solutions

Date

2008
Proceedings Paper
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dc.contributor.authorMartens, Koen
dc.contributor.authorKaczer, Ben
dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-17T08:51:04Z
dc.date.available2021-10-17T08:51:04Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14130
dc.source.conference4th International SiGe Technology and Device Meeting - ISTDM
dc.source.conferencedate11/05/2008
dc.source.conferencelocationHsinchu Taiwan
dc.title

Electrical interface characterization of non-Si Based MOSFETs: challenges and solutions

dc.typeProceedings paper
dspace.entity.typePublication
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