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Effective post-etch residue removal on low-K films using single wafer processing
Publication:
Effective post-etch residue removal on low-K films using single wafer processing
Date
2004
Proceedings Paper
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10407.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kesters, Els
;
Ghekiere, John
;
Van Doorne, Patrick
;
Vereecke, Guy
;
Mertens, Paul
;
Heyns, Marc
Journal
Abstract
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1895
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1895
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations