Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Substrate bias dependency of sense margin and retention in bulk FinFET 1T-DRAM cells
Publication:
Substrate bias dependency of sense margin and retention in bulk FinFET 1T-DRAM cells
Copy permalink
Date
2010
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Collaert, Nadine
;
Aoulaiche, Marc
;
De Keersgieter, An
;
De Wachter, Bart
;
Jurczak, Gosia
;
Altimime, Laith
Journal
Abstract
Description
Statistics
Views
1882
since deposited on 2021-10-18
3
last month
Acq. date: 2026-08-10
Citations
Statistics
Views
1882
since deposited on 2021-10-18
3
last month
Acq. date: 2026-08-10
Citations