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Substrate bias dependency of sense margin and retention in bulk FinFET 1T-DRAM cells
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Substrate bias dependency of sense margin and retention in bulk FinFET 1T-DRAM cells
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Date
2010-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Collaert, Nadine
;
Aoulaiche, Marc
;
De Keersgieter, An
;
De Wachter, Bart
;
Jurczak, Gosia
;
Altimime, Laith
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1877
since deposited on 2021-10-18
Acq. date: 2026-01-06
Citations
Metrics
Views
1877
since deposited on 2021-10-18
Acq. date: 2026-01-06
Citations