Publication:
Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs
Date
| dc.contributor.author | Pavanello, Marcelo Antonio | |
| dc.contributor.author | Martino, Joao Antonio | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T18:30:40Z | |
| dc.date.available | 2021-10-16T18:30:40Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12681 | |
| dc.source.beginpage | 1194 | |
| dc.source.endpage | 1200 | |
| dc.source.issue | 9 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 51 | |
| dc.title | Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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