Publication:

Using reduced-order models in D/A converter testing

Date

2002
Proceedings Paper
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dc.contributor.authorVargha, B.
dc.contributor.authorSchoukens, J.
dc.contributor.authorRolain, Y.
dc.date.accessioned2021-10-14T23:49:53Z
dc.date.available2021-10-14T23:49:53Z
dc.date.embargo9999-12-31
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7005
dc.source.beginpage701
dc.source.conferenceProceedings of the 19th IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate21/05/2002
dc.source.conferencelocationAnchorage, AK USA
dc.source.endpage706
dc.title

Using reduced-order models in D/A converter testing

dc.typeProceedings paper
dspace.entity.typePublication
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