Publication:

Stress in Single-and Multiribbon Complementary FETs (CFETs): Evolution in Process Flow and Impact on Drive Current

Date

2025-JUL 15
Journal article
https://doi.org/10.1109/TED.2025.3584743
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-0365-2066
cris.virtual.orcid0000-0002-5849-3384
cris.virtualsource.departmentcea7b917-75cc-4012-9b9c-2c77adaccfb9
cris.virtualsource.departmentdb73cf2d-2000-429c-bc92-553a1ef3e876
cris.virtualsource.orcidcea7b917-75cc-4012-9b9c-2c77adaccfb9
cris.virtualsource.orciddb73cf2d-2000-429c-bc92-553a1ef3e876
dc.contributor.authorDutta, Achintya
dc.contributor.authorEneman, Geert
dc.contributor.authorThomas, Nicole K.
dc.contributor.authorMatagne, Philippe
dc.contributor.authorRadosavljevic, Marko
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecMatagne, Philippe::0000-0003-0365-2066
dc.date.accessioned2025-07-27T03:57:17Z
dc.date.available2025-07-27T03:57:17Z
dc.date.issued2025-JUL 15
dc.identifier.doi10.1109/TED.2025.3584743
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45938
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage4735
dc.source.endpage4741
dc.source.issue9
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume72
dc.subject.keywordsDEPENDENCE
dc.title

Stress in Single-and Multiribbon Complementary FETs (CFETs): Evolution in Process Flow and Impact on Drive Current

dc.typeJournal article
dspace.entity.typePublication
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