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Solid state MAS NMR spectroscopic characterization of plasma damage and UV modification of low-k dielectric films
Publication:
Solid state MAS NMR spectroscopic characterization of plasma damage and UV modification of low-k dielectric films
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Date
2005
Proceedings Paper
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10999.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Abell, Thomas
;
Houthoofd, Kristof
;
Iacopi, Francesca
;
Grobet, Piet
;
Maex, Karen
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1855
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations
Metrics
Views
1855
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations