Publication:
Parametric test for next generation semiconductor technologies
Date
| dc.contributor.author | De Wachter, Bart | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Fodor, Ferenc | |
| dc.contributor.author | Hiblot, Gaspard | |
| dc.contributor.imecauthor | De Wachter, Bart | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Fodor, Ferenc | |
| dc.contributor.imecauthor | Hiblot, Gaspard | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.contributor.orcidimec | Hiblot, Gaspard::0000-0002-3869-965X | |
| dc.date.accessioned | 2021-10-24T04:00:45Z | |
| dc.date.available | 2021-10-24T04:00:45Z | |
| dc.date.issued | 2017 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28177 | |
| dc.source.conference | Semiconductor Test Summit - NIWeek | |
| dc.source.conferencedate | 22/05/2017 | |
| dc.source.conferencelocation | Austin, TX USA | |
| dc.title | Parametric test for next generation semiconductor technologies | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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