Publication:
Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors
Date
| dc.contributor.author | Moens, P. | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-10-15T05:45:44Z | |
| dc.date.available | 2021-10-15T05:45:44Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7907 | |
| dc.source.beginpage | 214 | |
| dc.source.conference | Proceedings 41st Annual IEEE International Reliability Physics Symposium | |
| dc.source.conferencedate | 30/03/2003 | |
| dc.source.conferencelocation | Dallas, TX USA | |
| dc.source.endpage | 221 | |
| dc.title | Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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