Publication:
Effect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristics
Date
| dc.contributor.author | Poyai, Amporn | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Gaubas, Eugenijus | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T22:51:18Z | |
| dc.date.available | 2021-10-14T22:51:18Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6738 | |
| dc.source.beginpage | CM1-14 | |
| dc.source.conference | Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting | |
| dc.source.conferencedate | 5/06/2002 | |
| dc.source.conferencelocation | Liège Belgium | |
| dc.title | Effect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristics | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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