Reliability aware design:  from single defect physics to circuit simulations

dc.contributor.author	Kaczer, Ben
dc.contributor.author	Toledano Luque, Maria
dc.contributor.author	Franco, Jacopo
dc.contributor.author	Weckx, Pieter
dc.contributor.author	Grasser, Tibor
dc.contributor.author	Roussel, Philippe
dc.contributor.author	Groeseneken, Guido
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	Franco, Jacopo
dc.contributor.imecauthor	Weckx, Pieter
dc.contributor.imecauthor	Roussel, Philippe
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimec	Franco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimec	Roussel, Philippe::0000-0002-0402-8225
dc.date.accessioned	2021-10-20T12:01:19Z
dc.date.available	2021-10-20T12:01:19Z
dc.date.issued	2012
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/20891
dc.identifier.url	http://www.cnt.fraunhofer.de/en/Events_Press/events_trade_fairs/cnt_research_day.html
dc.source.conference	3rd Fraunhofer CNT Research Day
dc.source.conferencedate	8/11/2012
dc.source.conferencelocation	Dresden Germany
dc.title	Reliability aware design: from single defect physics to circuit simulations
dc.type	Oral presentation
dspace.entity.type	Publication
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