Publication:
Machine Learning-Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks
| dc.contributor.author | Kocak, Husnu Murat | |
| dc.contributor.author | Davis, Jesse | |
| dc.contributor.author | Houssa, Michel | |
| dc.contributor.author | Naskali, Ahmet Teoman | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.date.accessioned | 2025-02-04T07:48:40Z | |
| dc.date.available | 2024-12-03T16:44:53Z | |
| dc.date.available | 2025-02-04T07:48:40Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/TSM.2024.3450286 | |
| dc.identifier.issn | 0894-6507 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44908 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 615 | |
| dc.source.endpage | 619 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | |
| dc.source.numberofpages | 5 | |
| dc.source.volume | 37 | |
| dc.subject.keywords | CLASSIFICATION | |
| dc.title | Machine Learning-Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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