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Nanoscale evidence for the superior reliability of SiGe high-k pMOSFETs
Publication:
Nanoscale evidence for the superior reliability of SiGe high-k pMOSFETs
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Waltl, Michael
;
Grill, Alexander
;
Rzepa, Gerhard
;
Goes, Wolfgang
;
Franco, Jacopo
;
Kaczer, Ben
;
Mitard, Jerome
;
Grasser, Tibor
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Abstract
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1936
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations
Metrics
Views
1936
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations