Publication:
Nanoscale evidence for the superior reliability of SiGe high-k pMOSFETs
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1942 since deposited on 2021-10-23
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Acq. date: 2026-01-26
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Statistics
Views
1942 since deposited on 2021-10-23
2last month
2last week
Acq. date: 2026-01-26
Citations