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Pinhole density measurements of barriers deposited on low-k films
Publication:
Pinhole density measurements of barriers deposited on low-k films
Date
2003-11
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Shamiryan, Denis
;
Abell, Thomas
;
Le, Quoc Toan
;
Maex, Karen
Journal
Microelectronic Engineering
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1908
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
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Views
1908
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations