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Improving EUV imaging at tighter pitch using a tuned-ML mask stack
Publication:
Improving EUV imaging at tighter pitch using a tuned-ML mask stack
Date
2014
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wood, Obert
;
Philipsen, Vicky
;
Soltwisch, Victor
;
Raghunathan, Sudhar
;
Verduijn, Erik
;
Hendrickx, Eric
;
Scholze, Frank
;
Mangat, Pawitter
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1922
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Metrics
Views
1922
since deposited on 2021-10-22
419
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations