Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Fast convolution based thermal model for 3D-ICs: methodology, accuracy analysis and package impact
Publication:
Fast convolution based thermal model for 3D-ICs: methodology, accuracy analysis and package impact
Date
2014-12
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maggioni, Federica
;
Oprins, Herman
;
Beyne, Eric
;
De Wolf, Ingrid
;
Baelmans, Martine
Journal
Microelectronics Journal
Abstract
Description
Metrics
Views
1911
since deposited on 2021-10-22
Acq. date: 2025-10-26
Citations
Metrics
Views
1911
since deposited on 2021-10-22
Acq. date: 2025-10-26
Citations