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Fast convolution based thermal model for 3D-ICs: methodology, accuracy analysis and package impact
Publication:
Fast convolution based thermal model for 3D-ICs: methodology, accuracy analysis and package impact
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maggioni, Federica
;
Oprins, Herman
;
Beyne, Eric
;
De Wolf, Ingrid
;
Baelmans, Martine
Journal
Microelectronics Journal
Abstract
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1917
since deposited on 2021-10-22
Acq. date: 2026-07-16
Citations
Statistics
Views
1917
since deposited on 2021-10-22
Acq. date: 2026-07-16
Citations