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An analysis of the NBTI-induced threshold voltage shift evaluated by different techniques
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An analysis of the NBTI-induced threshold voltage shift evaluated by different techniques
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Date
2009-05
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ji, Zhigang
;
Zhang, Jian Fu
;
Chang, Mo Huai
;
Kaczer, Ben
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
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1848
since deposited on 2021-10-17
Acq. date: 2025-12-09
Citations
Metrics
Views
1848
since deposited on 2021-10-17
Acq. date: 2025-12-09
Citations