Publication:

Origin of wide retention distribution in 1T Floating Body RAM

Date

2012
Proceedings Paper
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dc.contributor.authorAoulaiche, Marc
dc.contributor.authorNicoletti, Talitha
dc.contributor.authorVeloso, Anabela
dc.contributor.authorRoussel, Philippe
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-20T10:01:59Z
dc.date.available2021-10-20T10:01:59Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20294
dc.source.beginpage6.4
dc.source.conferenceIEEE International SOI Conference
dc.source.conferencedate1/10/2012
dc.source.conferencelocationNapa, CA USA
dc.title

Origin of wide retention distribution in 1T Floating Body RAM

dc.typeProceedings paper
dspace.entity.typePublication
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