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Statistical insight into controlled forming and forming free stacks for HfOx RRAM
Publication:
Statistical insight into controlled forming and forming free stacks for HfOx RRAM
Date
2013
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Raghavan, Naga
;
Fantini, Andrea
;
Degraeve, Robin
;
Roussel, Philippe
;
Goux, Ludovic
;
Wouters, Dirk
;
Groeseneken, Guido
;
Jurczak, Gosia
Journal
Microelectronic Engineering
Abstract
Description
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1891
since deposited on 2021-10-21
Acq. date: 2025-10-29
Citations
Metrics
Views
1891
since deposited on 2021-10-21
Acq. date: 2025-10-29
Citations