Publication:

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

Date

2018-12

Proceedings Paper

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Author(s)

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Vandooren, Anne

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Arimura, Hiroaki

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Ragnarsson, Lars-Ake

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Hellings, Geert

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De Heyn, Vincent

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Groeseneken, Guido

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Horiguchi, Naoto

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Ryckaert, Julien

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Collaert, Nadine

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Linten, Dimitri

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Metrics

1987 since deposited on 2021-10-25

Acq. date: 2026-01-07