Publication:

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

Date

2018-12

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

;

;

;

Vandooren, Anne

;

Arimura, Hiroaki

;

Ragnarsson, Lars-Ake

;

Hellings, Geert

;

;

;

De Heyn, Vincent

;

Groeseneken, Guido

;

Horiguchi, Naoto

;

Ryckaert, Julien

;

Collaert, Nadine

;

Linten, Dimitri

;

;

Metrics

1987 since deposited on 2021-10-25

1last month

Acq. date: 2025-12-10