Publication:

Trapping and reliability assessment in d-mode GaN-based MIS-HEMTs for power applications

Date

2014

Journal article

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Author(s)

Meneghini, Matteo

;

;

;

Stoffels, Steve

;

Van Hove, Marleen

;

;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

Journal

IEEE Transactions on Power Electronics

Metrics

1934 since deposited on 2021-10-22

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Acq. date: 2025-12-13