Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

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22837.pdf 628.95 KB

Author(s)

Zhang, Cher Xuang

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Francis, Sarah Ashley

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Fleetwood, Daniel M.

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Schrimpf, Ronald D.

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Galloway, Kenneth F.

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Journal

IEEE Transactions on Nuclear Science

Metrics

1924 since deposited on 2021-10-19

Acq. date: 2025-10-23